S. Afr. J. Ind. Eng.- PDF Download - Art. IDS2224-78902019000100018

South African Journal of Industrial Engineering
On-line version ISSN 2224-7890
Print version ISSN 1012-277X

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WANG, C.C. and WU, B.D.. Classification and prediction of wafer probe yield in DRAM manufacturing using Mahalanobis-Taguchi system and neural network. S. Afr. J. Ind. Eng. [online]. 2019, vol.30, n.1, pp.248-256. ISSN 2224-7890.

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