South African Journal of ScienceOn-line version ISSN 1996-7489
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SWAIN, Bibhu P.. The structural characterisation of HWCVD-deposited nanocrystalline silicon films. S. Afr. j. sci. [online]. 2009, vol.105, n.1-2, pp. 77-80. ISSN 1996-7489.
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