South African Journal of Industrial Engineering
versión On-line ISSN 2224-7890
versión impresa ISSN 1012-277X
MATOPE, S. et al. Micro-material handling employing e-beam generated topographies of copper and aluminium. S. Afr. J. Ind. Eng. [online]. 2011, vol.22, n.2, pp.175-188. ISSN 2224-7890.
This paper focuses on the employment of copper and aluminium in a micro-material handling system actuated by Van der Waals forces. Electron beam (e-beam) evaporator deposited both materials on a silicon substrate at a rate of 0.6-1.2 Angstroms/second, vacuum pressure between 2x10-6 and 3x10-6mbar, and at a current less than 10mA. A Veeco NanoMan V Atomic Force Microscope with Nanoscope version 7.3 software was used to analyse the root mean square (rms) surface roughnesses of the generated topographies. Rumpf-Rabinovich's rms formula was used to determine the Van der Waals forces exerted by the surfaces. It was synthesised that an e-beam deposition of 7 minutes' duration on both materials produced an optimum micro-material handling solution, with copper suitable for the pick-up position and aluminium for the placement position.