Journal of the Southern African Institute of Mining and Metallurgy
versión On-line ISSN 2411-9717
versión impresa ISSN 0038-223X
FOURIE, D. y MINNITT, R.C.A.. The 'simulated chip-sample model' as a method for quantifying error and bias in sampling thin carboniferous reef types. J. S. Afr. Inst. Min. Metall. [online]. 2014, vol.114, n.1, pp.19-29. ISSN 2411-9717.
A brief history of channel sampling in South African gold mines is followed by a chronicle of different sampling events and sampling methods that used the traditional 'hammer and chisel' approach as well as diamond core extraction of the sample. The problems associated with each method of sample collection are documented and the use of a laser scanner to measure the exact volumes of sample material extracted from a correctly delimited sample site are considered. Areas where increment delimitation errors (IDEs), increment extraction errors (IEEs), increment weighting errors (IWEs), and increment preparation errors (IPEs) occur were investigated. A 'simulated chip sample model' is introduced and provides the basis for comparing the percentages of error introduced as a result of improper sampling. The heterogeneity experiment showed that reefs that are more homogenous tend have lower extraction errors than the more complex carbon-rich reefs, which may contribute to understanding the poor mine call factor on mines exploiting the latter types of reef.
Palabras clave : channel sampling; chip sampling; error; bias; modelling.